COMPREHEVSIVE SOLUTIONS FOR ATE
Silicon Turnkey Solutions offers the following test services to provide a Product Development project, the most technologically sound Hardware and Software for it’s successful implementation.
| Test Program Development |
Characterization |
 |
Leading edge development tools / cross compilers |
 |
Integration of EDA-to-Test tools for rapid deployment of test programs |
 |
Device performance to design across temperature, voltage and process margins |
 |
High-Speed Busses |
|
Test Program |
 |
Extensive Experience in: |
 |
Mixed Signal Applications |
 |
PCI Express, Serial ATA |
 |
Network Processors |
 |
High Speed SERDES |
 |
Hyper Transport, Dual TMDS |
 |
SRAM, SDRAM, DDR1, DDR2, QDR |
|
 |
Yield Enhancement with Customer Collaboration |
 |
Test Time Reduction / Optimization / Parallel Testing |
|
Conversion Tools |
 |
VTRAN |
 |
VCAP |
 |
TEST-2020 [Proprietary Test Software |
 |
Cross Platform Program and Pattern Conversion |
 |
Extremely High Coverage by Get-go |
 |
Test Vector Conversion Capability |
 |
Exceptionally Fast Test Program Development Time |
|
 |
Quick Timing Certification and Corrections |
 |
Reduced Costly Iterations |
|
 |
Easy-to-use Test Program and Debug Simulations |
|
Engineering Capabilities and Support |
 |
Sustained Product Engineering |
 |
Expertise in Mixed Signal, High-Speed Digital |
 |
Memories/ ASIC’s/ Logic |
 |
HFi RF Testing, SOC’s |
 |
Device Analysis |
|
 |
Electrical Test Characterization |
 |
Curve Tracer |
 |
CSAM – Acoustic Microscopy |
 |
Thermal Analysis |
 |
X-Ray Analysis |
 |
DPA – Destructive Physical Analysis |
 |
Moire’ Analysis |
 |
Micro Sectioning |
|
| Production Capabilities |
Final Test |
|
 |
Automated Handler Testing |
 |
Multi-Site Testing – Up to 16 sites |
 |
Multi-Temperature Testing |
 |
Memory & Flash Specialty Solutions |
|
 |
Manual Testing |
 |
Thermonics |
|
 |
Full Production Support (No Touch Sub-Contracting |
|
Wafer Probe/ Wafer Sort |
 |
300 MM Prober |
 |
Vertical / Cantilever Probing |
 |
Thermal Control |
 |
Multi-Site Probing |
 |
Bake Retention |
 |
Bumped Wafer Probing |
 |
Electronic Support |
 |
Wafer Map Template Generation |
 |
Inkless Probe |
 |
Prober Wafer Mapping |
|
|
Value Added Up-screening
Systems Rental |
 |
24 X 7 Remote Access |
 |
Engineering & Technical Support |
 |
Real-time Scheduling |
 |
Offline Stations for Data Verification |
 |
Access to Commercial EDA Tools [VTRAN] |
 |
FTP for Data / Software |
|
Test Hardware |
|