SILICON TURNKEY SOLUTIONS
ATE Capabilities

Precision-driven Testing of Increasingly Complex and High-speed Devices

 

 
 
 
 

COMPREHEVSIVE SOLUTIONS FOR ATE

Silicon Turnkey Solutions offers the following test services to provide a Product Development project, the most technologically sound Hardware and Software for it’s successful implementation.

Test Program Development

Characterization

Leading edge development tools / cross compilers

Integration of  EDA-to-Test tools for rapid deployment of test programs

Device performance to design across temperature, voltage and process margins

High-Speed Busses

Test Program

Extensive Experience in:

Mixed Signal Applications

PCI Express, Serial ATA

Network Processors

High Speed SERDES

Hyper Transport, Dual TMDS

SRAM, SDRAM, DDR1, DDR2, QDR

Yield Enhancement with Customer Collaboration

Test Time Reduction / Optimization / Parallel Testing

Conversion Tools

VTRAN

VCAP

TEST-2020 [Proprietary Test Software

Cross Platform Program and Pattern Conversion

Extremely High Coverage by Get-go

Test Vector Conversion Capability

Exceptionally Fast Test Program Development Time

Quick Timing Certification and Corrections

Reduced Costly Iterations

Easy-to-use Test Program and Debug Simulations

Engineering Capabilities and Support

Sustained Product Engineering

Expertise in Mixed Signal, High-Speed Digital

Memories/ ASIC’s/ Logic

HFi RF Testing, SOC’s

Device Analysis

Electrical Test Characterization

Curve Tracer

CSAM – Acoustic Microscopy

Thermal Analysis

X-Ray Analysis

DPA – Destructive Physical Analysis

Moire’ Analysis

Micro Sectioning

Production Capabilities

Final Test

Automated Handler Testing

Multi-Site Testing – Up to 16 sites

Multi-Temperature Testing

Memory & Flash Specialty Solutions

Manual Testing

Thermonics

Full Production Support (No Touch Sub-Contracting

Wafer Probe/ Wafer Sort

300 MM Prober

Vertical / Cantilever Probing

Thermal Control

Multi-Site Probing

Bake Retention

Bumped Wafer Probing

Electronic Support

Wafer Map Template Generation

Inkless Probe

Prober Wafer Mapping

Value Added Up-screening

Systems Rental

24 X 7 Remote Access

Engineering & Technical Support

Real-time Scheduling

Offline Stations for Data Verification

Access to Commercial EDA Tools [VTRAN]

FTP for Data / Software

Test Hardware

 
 
     

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